New Test Data Decompressor for Low Power Applications.
Grzegorz MrugalskiJanusz RajskiDariusz CzyszJerzy TyszerPublished in: DAC (2007)
Keyphrases
- test data
- low power
- power consumption
- high speed
- low cost
- test set
- wireless transmission
- test cases
- single chip
- training data
- training set
- low power consumption
- high power
- data sets
- cmos technology
- digital signal processing
- vlsi circuits
- logic circuits
- vlsi architecture
- power reduction
- search based testing
- software testing
- cross validation
- training samples
- feature extraction
- database systems
- machine learning