Runtime-Coordinated Scalable Incremental Checksum Testing of Combinational Circuits.
Stefan AndreiWei-Ngan ChinAlbert Mo Kim ChengYongxin ZhuPublished in: RTCSA (2005)
Keyphrases
- asynchronous circuits
- logic circuits
- single pass
- data driven
- incremental learning
- cooperative
- high speed
- test cases
- data sets
- artificial intelligence
- multi agent
- genetic algorithm
- delay insensitive
- incremental version
- test generation
- databases
- logic synthesis
- high level synthesis
- quantum computing
- analog circuits
- memory efficient
- web scale
- test suite
- website
- machine learning