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Structure-Based Specification-Constrained Test Frequency Generation for Linear Analog Circuits.
Soon-Jyh Chang
Chung-Len Lee
Jwu E. Chen
Published in:
J. Inf. Sci. Eng. (2003)
Keyphrases
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analog circuits
high level
digital circuits
artificial intelligence
real time
genetic algorithm
decision making
image processing
test data
generation process