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Extremum-seeking-based adaptive scan for atomic force microscopy.

Kaixiang WangChris ManzieDragan Nesic
Published in: CDC (2017)
Keyphrases
  • atomic force microscopy
  • machine learning
  • case study
  • database systems
  • cooperative
  • evolutionary algorithm
  • multiresolution
  • probability distribution
  • data driven
  • adaptive learning
  • adaptive algorithms