Login / Signup
Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation.
M. H. Konijnenburg
Hans van der Linden
Ad J. van de Goor
Published in:
Asian Test Symposium (1999)
Keyphrases
</>
conflict directed
test generation
variable ordering
test cases
forward checking
conflict resolution
fault diagnosis
constraint satisfaction problems
constraint satisfaction
quality assurance
branch and bound algorithm
software testing
static analysis
forward search
orders of magnitude
quantified boolean formulae