Login / Signup
The impact of trapping centers on AlGaN/GaN resonant tunneling diode.
Haoran Chen
Lin-An Yang
Xiaoxian Liu
Zhangming Zhu
Jun Luo
Yue Hao
Published in:
IEICE Electron. Express (2013)
Keyphrases
</>
computer simulation
edge detection
high impact
data mining
knowledge base
image processing
website
artificial neural networks
light emitting
schottky barrier