VMLC: Statistical Process Control for Image Classification in Manufacturing.
Philipp MaschaPublished in: ACML (2023)
Keyphrases
- statistical process control
- image classification
- control charts
- quality control
- bag of words
- image representation
- visual features
- visual words
- feature extraction
- image features
- manufacturing systems
- manufacturing processes
- production planning
- cumulative sum
- bag of features
- semiconductor manufacturing
- sparse coding
- manufacturing industry
- manufacturing environment
- class specific
- manufacturing process
- remotely sensed data
- sparse representation
- artificial neural networks
- object recognition
- mass customization
- cell formation
- image processing
- decision making