STATISTICAL PROCESS CONTROL
Experts
- Muhammad Riaz
- Philippe Castagliola
- Michael B. C. Khoo
- Abdul Haq
- Muhammad Aslam
- Christos Koukouvinos
- Nasir Abbas
- Saddam Akber Abbasi
- Chi-Hyuck Jun
- Vasileios Alevizakos
- Linda Lee Ho
- Kashinath Chatterjee
- Ronald J. M. M. Does
- Subha Chakraborti
- Hafiz Zafar Nazir
- Zhang Wu
- Muhammad Noor-ul-Amin
- Ming Ha Lee
- Amirhossein Amiri
- Tahir Mahmood
- Zhaojun Wang
- William H. Woodall
- Nasrullah Khan
- Su-Fen Yang
- Muhammad Abid
- Muhammad Hisyam Lee
- Giovanni Celano
- Babar Zaman
- Zhonghua Li
- Mu'azu Ramat Abujiya
- Elena Moltchanova
- Kim Phuc Tran
- Sajal Saha
- Rassoul Noorossana
- Michael Boon Chong Khoo
- Seyed Taghi Akhavan Niaki
- Sajid Ali
- Stelios Psarakis
- Jean-Claude Malela-Majika
Venues
- Qual. Reliab. Eng. Int.
- Commun. Stat. Simul. Comput.
- Comput. Ind. Eng.
- CoRR
- Technometrics
- IEEE Access
- Expert Syst. Appl.
- Symmetry
- Eur. J. Oper. Res.
- Comput. Stat. Data Anal.
- Int. J. Prod. Res.
- J. Intell. Manuf.
- IEEM
- Trans. Inst. Meas. Control
- J. Oper. Res. Soc.
- Comput. Chem. Eng.
- J. Multivar. Anal.
- J. Approx. Theory
- Inf. Sci.
- Appl. Soft Comput.
- J. Intell. Fuzzy Syst.
- Int. J. Comput. Integr. Manuf.
- WSC
- J. Comput. Appl. Math.
- IEEE Softw.
- IEEE Trans. Vis. Comput. Graph.
- Neurocomputing
- SMC
- Comput. Oper. Res.
- Int. J. Account. Inf. Syst.
- Int. J. Comput. Intell. Syst.
- Int. CMG Conference
- Appl. Math. Comput.
- Soft Comput.
- Int. J. Syst. Sci.
- CASE
- Sensors
- ACM Conference on Computer Science
- IEEE Trans. Instrum. Meas.
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