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TAO-BIST: A framework for testability analysis and optimization forbuilt-in self-test of RTL circuits.
Srivaths Ravi
Ganesh Lakshminarayana
Niraj K. Jha
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
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main contribution
statistical analysis
database
data analysis
high speed
theoretical framework
optimization scheme
built in self test
feature selection
database systems
image analysis
evolutionary algorithm
test cases
optimization method
optimization methods
analysis tool