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A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips.
Rajesh Tiwari
Abhijeet Shrivastava
Mahit Warhadpande
Srivaths Ravi
Rubin A. Parekhji
Published in:
VTS (2008)
Keyphrases
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test data
test cases
training data
test set
data sets
training set
search based testing
database
training and test data
training samples
computer vision
testing process
text classification
active learning
decision trees
unseen data
data mining