Login / Signup
High-level test compaction techniques.
Srivaths Ravi
Ganesh Lakshminarayana
Niraj K. Jha
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
</>
high level
low level
databases
multiresolution
programming language
intermediate level
real time
lower level
low level features
test data
test cases
lower bound
three dimensional
decision trees
information systems
computer vision
neural network