Low Cost Bist for Edac Circuits.
Dariusz BaduraAndrzej HlawiczkaPublished in: Asian Test Symposium (1997)
Keyphrases
- low cost
- built in self test
- low power
- cost effective
- integrated circuit
- logic circuits
- real time
- logic synthesis
- delay insensitive
- highly efficient
- quantum computing
- circuit design
- digital camera
- high speed
- databases
- social networks
- tunnel diode
- vlsi circuits
- artificial intelligence
- data acquisition
- digital circuits
- cmos technology
- analog circuits
- electronic circuits
- website
- information retrieval
- decision trees
- analog vlsi
- case study
- shift register
- cost function
- data sets