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Multiple stuck-at fault testability of self-testing checkers.

Takashi NanyaSamiha MouradEdward J. McCluskey
Published in: FTCS (1988)
Keyphrases
  • database
  • fault diagnosis
  • fault detection
  • image processing
  • evolutionary algorithm
  • neural network
  • genetic algorithm
  • metadata
  • training data
  • computer games
  • software testing