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Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test.

Jeanne BickfordNazmul HabibJohn GossRobert McMahonRajiv V. JoshiRouwaida Kanj
Published in: ISQED (2010)
Keyphrases
  • rapid development
  • life cycle
  • technological advances
  • database
  • computer systems
  • cloud computing
  • test cases
  • statistically significant
  • product design