Jeanne Bickford

Publication Activity (10 Years)

Years Active: 2006-2010
Publications (10 Years): 0

Publications

Jeanne Bickford, Nazmul Habib, John Goss, Robert McMahon, Rajiv V. Joshi, Rouwaida Kanj
Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. ISQED (2010)
Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, Ralf Sommer, Michael Pronath, Andreas Ripp
DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. DATE (2006)
Jeanne Bickford, Jason Hibbeler, Markus Bühler, Jürgen Koehl, Dirk Müller, Sven Peyer, Christian Schulte
Yield Improvement by Local Wiring Redundancy. ISQED (2006)