One-Bit ΣΔ-Encoded Stimulus Generation for On-Chip ADC Test.

Shakeel Ahmad Jerzy J. Dabrowski

Published in: J. Circuits Syst. Comput. (2020)

Keyphrases

high speed
run length
analog to digital converter
single chip
real time
low cost
random access memory
data sets
neural network
evolutionary algorithm
test data
high density
image sensor
programmable logic