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A Voltage-Based Leakage Current Calculation Scheme and its Application to Nanoscale MOSFET and FinFET Standard-Cell Designs.

Zia AbbasAntonio MastrandreaMauro Olivieri
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
  • silicon dioxide
  • low voltage
  • leakage current
  • image sequences
  • learning environment
  • signal processing
  • power system
  • power supply