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Influence and model of gate oxide breakdown on CMOS inverters.

Rosana RodríguezJames H. StathisBarry P. LinderRajiv V. JoshiChing-Te Chuang
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • computational model
  • mathematical model
  • high level
  • management system
  • statistical model
  • cost function
  • hidden markov models
  • parameter estimation
  • experimental data