Login / Signup
Influence and model of gate oxide breakdown on CMOS inverters.
Rosana Rodríguez
James H. Stathis
Barry P. Linder
Rajiv V. Joshi
Ching-Te Chuang
Published in:
Microelectron. Reliab. (2003)
Keyphrases
</>
computational model
mathematical model
high level
management system
statistical model
cost function
hidden markov models
parameter estimation
experimental data