Scan BIST Targeting Transition Faults Using a Markov Source.

Hangkyu Lee Irith Pomeranz Sudhakar M. Reddy

Published in: ISQED (2004)

Keyphrases

built in self test
integrated circuit
markov chain
fault diagnosis
conditional independence
model based diagnosis
multiple sources
markov process
database
random variables
artificial intelligence
databases
fuzzy logic
expert systems
markov model
machine learning
root cause
fault model