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Efficient BIST TPG design and test set compaction via input reduction.

Chih-Ang ChenSandeep K. Gupta
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1998)
Keyphrases
  • test set
  • training set
  • test data
  • error rate
  • training data
  • class distribution
  • data sets
  • machine learning
  • information retrieval
  • user interface
  • model selection
  • training and test sets