Chip-Level Diagnostic Strategy for Full-Scan Designs with Multiple Faults.

Yu-Chiun Lin Shi-Yu Huang

Published in: Asian Test Symposium (2003)

Keyphrases

multiple faults
fault diagnosis
medical diagnosis
expert systems
higher level
low cost
high speed
high density
levels of abstraction
data sets
decision making
search strategy
simulation model
selection strategy
optimal strategy
discrete event