On the feasibility of combining on-line-test and self repair for logic circuits.

Tobias Koal Markus Ulbricht Piet Engelke Heinrich Theodor Vierhaus

Published in: DDECS (2013)

Keyphrases

logic circuits
low power
power consumption
power dissipation
data model
query language
low cost
test cases
functional decomposition
tunnel diode
gate array