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On the feasibility of combining on-line-test and self repair for logic circuits.
Tobias Koal
Markus Ulbricht
Piet Engelke
Heinrich Theodor Vierhaus
Published in:
DDECS (2013)
Keyphrases
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logic circuits
low power
power consumption
power dissipation
data model
query language
low cost
test cases
functional decomposition
tunnel diode
gate array