Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip.
Kuo-Liang ChengChia-Ming HsuehJing-Reng HuangJen-Chieh YehChih-Tsun HuangCheng-Wen WuPublished in: Asian Test Symposium (2001)
Keyphrases
- built in self test
- hardware and software
- level parallelism
- memory usage
- power consumption
- automatically generate
- memory requirements
- design methodology
- main memory
- computing power
- low memory
- neural network
- embedded systems
- integrated circuit
- database
- random access
- memory space
- memory size
- address space
- artificial intelligence