The optimistic update theorem for path delay testing in sequential circuits.

Soumitra Bose Prathima Agrawal Vishwani D. Agrawal

Published in: J. Electron. Test. (1993)

Keyphrases

power dissipation
high speed
shortest path
delay insensitive
database
path length
von neumann
database systems
test set
test cases
steady state
endpoints
path selection
tunnel diode