A System for Ammeter Inspection Task.

Ruqiao Xu Jiasheng Guo Muwei Yang Qiang Wang Ping Ni Chuanzi Xu

Published in: ICCCV (2020)

Keyphrases

quality control
multiscale
visual inspection
high quality
image analysis
defect detection
automatic inspection
real time
neural network
image processing
case study
pairwise
relational databases
software engineering
multi view