Concurrent transient fault simulation for analog circuits.

Junwei Hou Abhijit Chatterjee

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)

Keyphrases

analog circuits
fault diagnosis
neural network
steady state
fault detection
digital circuits
multiple faults
mathematical model
simulation model
simulation environment
machine learning
decision making
expert systems
wavelet packet transform