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An Overview of Failure Mechanisms in Embedded Flash Memories.
Olivier Ginez
Jean Michel Daga
Marylene Combe
Patrick Girard
Christian Landrault
Serge Pravossoudovitch
Arnaud Virazel
Published in:
VTS (2006)
Keyphrases
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embedded systems
neural network
success or failure
content addressable
database
databases
artificial intelligence
information systems
associative memory
root cause
short term memory
failure prediction
control software