Multi-cycle Test with Partial Observation on Scan-Based BIST Structure.

Yasuo Sato Hisato Yamaguchi Makoto Matsuzono Seiji Kajihara

Published in: Asian Test Symposium (2011)

Keyphrases

built in self test
machine learning
computer vision
hierarchical structure
complex structures
databases
artificial intelligence
decision making
data structure
search algorithm
test cases
tree structure
structural information
image structure
integrated circuit