Reliability optimization of analog integrated circuits considering the trade-off between lifetime and area.
Xin PanHelmut GraebPublished in: Microelectron. Reliab. (2012)
Keyphrases
- integrated circuit
- trade off
- optimization problems
- global optimization
- optimization algorithm
- discrete optimization
- optimization process
- optimization method
- optimization methods
- data sets
- constrained optimization
- multiple objectives
- evolutionary algorithm
- highly reliable
- electron beam
- reliability analysis
- life span