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A novel accelerated test technique for assessment of mechanical reliability of solder interconnects.

Golta KhatibiW. WroczewskiB. WeissH. Ipser
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • mechanical properties
  • failure rate
  • test data
  • real time
  • image processing
  • input output
  • reliability analysis
  • information retrieval
  • genetic algorithm