Simulation-based functional test generation for embedded processors.

Charles H.-P. Wen Li-C. Wang Kwang-Ting Cheng

Published in: HLDVT (2005)

Keyphrases

test generation
embedded processors
test cases
symbolic execution
design automation
static analysis
single chip
quality assurance
parallel implementation
software testing
computer vision
hardware and software
low power
monitoring system
object oriented
training set
image processing