Defect detection in indirect layered manufacturing.
Izzat BakhadyrovMohsen A. JafariTong FangAhmad SafariStephen C. DanforthNoshir A. LangranaPublished in: SMC (1998)
Keyphrases
- defect detection
- quality control
- manufacturing systems
- feature extraction
- manufacturing processes
- manufacturing environment
- operations management
- automated visual inspection
- production process
- manufacturing industry
- knowledge base
- fully connected
- automotive industry
- textured surfaces
- computer integrated manufacturing
- neural network
- material handling
- semiconductor manufacturing
- product quality
- production planning
- decision making
- information systems