An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation.
John KeaneTony Tae-Hyoung KimChris H. KimPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
- sensor data
- high speed
- low cost
- image sensor
- power system
- cmos image sensor
- sensor networks
- single chip
- vlsi implementation
- data acquisition
- multi sensor
- high density
- real time
- threshold selection
- transmission line
- signal processing
- analog vlsi
- physical design
- high voltage
- programmable logic
- low voltage
- power losses
- charge coupled device
- electric field
- sensor fusion
- operating conditions
- video camera
- low power