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Estimation of Analog Parametric Test Metrics Using Copulas.

Ahcène BounceurSalvador MirHaralampos-G. D. Stratigopoulos
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • parametric models
  • test data
  • estimation accuracy
  • semi parametric
  • estimation algorithm
  • data sets
  • neural network
  • multiscale
  • video sequences
  • multiresolution
  • least squares
  • circuit design
  • analog vlsi