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A low-cost built-in self-test scheme for an array of memories.

Yu-Jen HuangChe-Wei ChouJin-Fu Li
Published in: ETS (2010)
Keyphrases
  • low cost
  • low power
  • clustering algorithm
  • database systems
  • databases
  • e learning
  • image segmentation
  • associative memory
  • classification scheme
  • learning scheme
  • representation scheme
  • single chip
  • built in self test