An Evaluation on the Robustness of Five Popular Keypoint Descriptors to Image Modifications Specific to Laser Scanning Microscopy.
Devrim ÜnayStefan G. StanciuPublished in: IEEE Access (2018)
Keyphrases
- laser scanning
- keypoints
- microscopy images
- high resolution
- image features
- image analysis
- sift descriptors
- image data
- visual inspection
- input image
- image retrieval
- feature descriptors
- multiscale
- image matching
- image descriptors
- image segmentation
- test images
- illumination conditions
- single image
- position and orientation
- invariant features
- three dimensional
- camera images
- structure from motion
- lighting conditions
- complex scenes
- visual features
- image registration
- image sequences
- salient points
- computer vision