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Test data compression and test time reduction using an embedded microprocessor.

Sungbae HwangJacob A. Abraham
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2003)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • data sets
  • training set
  • image compression
  • testing process
  • search based testing
  • database
  • search algorithm
  • pairwise
  • software testing