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Development of Surface Inspection Machine for Organic Photo Conductor(OPC).
Osamu Nakayama
Shinji Kobayashi
Katsuyuki Omura
Takahiro Asai
Mitsuhiro Tomoda
Teruki Kamada
Published in:
MVA (1994)
Keyphrases
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surface inspection
machine vision
case study
expert systems
software engineering
real time
computer vision
image processing
information technology
principal component analysis
knowledge based systems
information processing
quality control
surface defects