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Bipolar-switching operated phase change memory (PCM) for improved high-temperature reliability.

Nicola CiocchiniMario LaudatoAndrea L. LacaitaDaniele IelminiM. BoniardiE. VaresiPaolo Fantini
Published in: ESSDERC (2016)
Keyphrases
  • high temperature
  • computing power
  • silicon dioxide
  • database
  • input output
  • positive and negative
  • main memory
  • memory requirements
  • high density
  • training phase