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True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines.

Graziella ScandurraCarmine CiofiCalogero PaceF. SperoniF. Alagi
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • statistical tests
  • neural network
  • straight line
  • database
  • data sets
  • databases
  • information retrieval
  • multi view
  • test cases
  • hough transform
  • multiple views
  • line drawings