F. Alagi

Publication Activity (10 Years)

Years Active: 2002-2011
Publications (10 Years): 0

Publications

F. Alagi
Hot-carrier-induced time dependent dielectric breakdown in high voltage pMOSFETs. Microelectron. Reliab. 51 (8) (2011)
F. Alagi
A first-order kinetics ageing model for the hot-carrier stress of high-voltage MOSFETs. Microelectron. Reliab. 51 (2) (2011)
F. Alagi
DMOS FET parameter drift kinetics from microscopic modeling. Microelectron. Reliab. 50 (1) (2010)
Graziella Scandurra, Carmine Ciofi, Calogero Pace, F. Speroni, F. Alagi
True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines. Microelectron. Reliab. 42 (9-11) (2002)