Login / Signup
On testing of sequential machines using circuit decomposition and stochastic modeling.
Sunil R. Das
Wen-Ben Jone
Amiya R. Nayak
Ian Choi
Published in:
IEEE Trans. Syst. Man Cybern. (1995)
Keyphrases
</>
high speed
test cases
decomposition method
logic synthesis
website
evolutionary algorithm
test suite
field programmable gate array
circuit design
decomposition algorithm
decomposition methods
analog circuits
logic circuits
single phase
hardware software co design