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Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method.
Usha Sandeep Mehta
Niranjan M. Devashrayee
Kankar S. Dasgupta
Published in:
SoC (2010)
Keyphrases
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test data
test set
data sets
similarity measure
training data
prior knowledge
training samples
test cases
computer vision
database systems
pairwise
distance measure
text classification
text categorization
error rate
hamming distance