Login / Signup

Fault modeling and fault equivalence in CMOS technology.

Marie-Lise FlottesChristian LandraultSerge Pravossoudovitch
Published in: J. Electron. Test. (1991)
Keyphrases
  • fault diagnosis
  • cmos technology
  • low power
  • power consumption
  • case study
  • spl times
  • high speed