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Influence of dicing damages on the thermo-mechanical reliability of bare-chip assemblies.

Matthias SteiertJürgen Wilde
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • high density
  • high speed
  • mechanical design
  • low cost
  • circuit design
  • databases
  • data structure
  • single chip
  • reliability analysis
  • prior studies
  • analog vlsi
  • reliability assessment