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Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill.
Dong Xiang
Kele Shen
Bhargab B. Bhattacharya
Xiaoqing Wen
Xijiang Lin
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
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integrated circuit
small number
case study
software engineering
infrared
electron beam
neural network
website
test cases
critical path
hardware description language