Thin-Wall Calculation for Layered Manufacturing.
Sara McMainsJordan SmithCarlo H. SéquinPublished in: J. Comput. Inf. Sci. Eng. (2003)
Keyphrases
- manufacturing systems
- manufacturing processes
- manufacturing environment
- quality control
- production planning
- manufacturing process
- raw material
- calculation method
- fully connected
- neural network
- semiconductor manufacturing
- manufacturing industry
- operations management
- decision making
- cell formation
- artificial intelligence
- climbing robot
- production line
- process planning
- production process
- product quality
- control system
- expert systems
- decision trees
- computer vision
- learning algorithm
- machine learning