Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System.
Motoki FukusimaAkio OhtaKatsunori MakiharaSeiichi MiyazakiPublished in: IEICE Trans. Electron. (2013)
Keyphrases
- si sio
- metal oxide
- x ray
- leakage current
- high speed
- artificial intelligence
- case study
- databases
- artificial neural networks
- bayesian networks
- room temperature
- solid state
- electron microscopy
- evolutionary algorithm
- video sequences
- decision trees
- clustering algorithm
- image processing
- information systems
- computer vision
- learning algorithm
- information retrieval
- real world