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Probabilistic simulation for reliability analysis of CMOS VLSI circuits.

Farid N. NajmRichard BurchPing YangIbrahim N. Hajj
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
  • vlsi circuits
  • reliability analysis
  • low power
  • data mining
  • condition monitoring
  • mixed signal
  • low cost
  • power consumption
  • power plant
  • power dissipation