Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults.

Chaowen Yu Sudhakar M. Reddy Irith Pomeranz

Published in: Asian Test Symposium (2004)

Keyphrases

pseudorandom
uniformly distributed
object detection
false positives
automatic detection
detection method
random number
built in self test
detection algorithm
test cases
fault diagnosis
neural network
feature selection
low cost
event detection
secret key